Interpretation of adaptability test of high and low temperature test chamber

The high and low temperature test chamber is mainly aimed at the adaptability test of electrical and electronic products, as well as other components and other materials in the storage, transportation and use of high temperature and low temperature environment.

The high and low temperature test chamber is mainly used to make the high and low temperature test chamber for the product in accordance with the requirements of national standards or user-defined requirements. Under low temperature, high temperature, and conditions, the physical and other related characteristics of the product are subjected to environmental simulation tests, and the product is judged by testing. Whether the performance of the product can still meet the predetermined requirements in order to be used for product design, improvement, identification and factory inspection.

Due to the relatively large volume of the high and low temperature test chamber, it is inconvenient to move or move and the circuit is complicated. When a fault occurs, it is often difficult for users to start. In order for the user to quickly determine and solve the fault by himself in time, some common maintenance of the high and low temperature test box is introduced below. Failure and treatment method.